Long-term fatigue and its probability of failure applied to dental implants
Resumen: It is well known that dental implants have a high success rate but even so, there are a lot of factors that can cause dental implants failure. Fatigue is very sensitive to many variables involved in this phenomenon. This paper takes a close look at fatigue analysis and explains a new method to study fatigue from a probabilistic point of view, based on a cumulative damage model and probabilistic finite elements, with the goal of obtaining the expected life and the probability of failure. Two different dental implants were analysed. The model simulated a load of 178¿N applied with an angle of 0°, 15°, and 20° and a force of 489¿N with the same angles. Von Mises stress distribution was evaluated and once the methodology proposed here was used, the statistic of the fatigue life and the probability cumulative function were obtained. This function allows us to relate each cycle life with its probability of failure. Cylindrical implant has a worst behaviour under the same loading force compared to the conical implant analysed here. Methodology employed in the present study provides very accuracy results because all possible uncertainties have been taken in mind from the beginning.
Idioma: Inglés
DOI: 10.1155/2016/8927156
Año: 2016
Publicado en: BioMed Research International 2016, 8927156 (2016), [8 pp.]
ISSN: 2314-6133

Factor impacto JCR: 2.476 (2016)
Categ. JCR: BIOTECHNOLOGY & APPLIED MICROBIOLOGY rank: 66 / 160 = 0.412 (2016) - Q2 - T2
Categ. JCR: MEDICINE, RESEARCH & EXPERIMENTAL rank: 65 / 128 = 0.508 (2016) - Q3 - T2

Factor impacto SCIMAGO: 0.885 - Medicine (miscellaneous) (Q1) - Biochemistry, Genetics and Molecular Biology (miscellaneous) (Q2) - Immunology and Microbiology (miscellaneous) (Q2)

Tipo y forma: Article (Published version)
Área (Departamento): Área Mec.Med.Cont. y Teor.Est. (Dpto. Ingeniería Mecánica)

Creative Commons You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use.


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