Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799
Resumen: Erratum of Micromachines 2019, 10(12), 799: In Section 3.1 (page 4) on the fourth line, it says “C/cm2”. It should be changed to “uC/cm2”.
Idioma: Inglés
DOI: 10.3390/mi11020211
Año: 2020
Publicado en: MICROMACHINES 11, 2 (2020), 211 [1 pp.]
ISSN: 2072-666X

Factor impacto JCR: 2.891 (2020)
Categ. JCR: INSTRUMENTS & INSTRUMENTATION rank: 23 / 64 = 0.359 (2020) - Q2 - T2
Categ. JCR: PHYSICS, APPLIED rank: 69 / 160 = 0.431 (2020) - Q2 - T2
Categ. JCR: NANOSCIENCE & NANOTECHNOLOGY rank: 76 / 106 = 0.717 (2020) - Q3 - T3
Categ. JCR: CHEMISTRY, ANALYTICAL rank: 46 / 83 = 0.554 (2020) - Q3 - T2

Factor impacto SCIMAGO: 0.574 - Control and Systems Engineering (Q2) - Mechanical Engineering (Q2) - Electrical and Electronic Engineering (Q2)

Tipo y forma: (Published version)
Área (Departamento): Área Física Materia Condensada (Dpto. Física Materia Condensa.)

Creative Commons You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use.


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