Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799

De Teresa, José María (Universidad de Zaragoza) ; Orús, Pablo ; Cordoba, Rosa ; Philipp, Patrick

Resumen: Erratum of Micromachines 2019, 10(12), 799: In Section 3.1 (page 4) on the fourth line, it says “C/cm2”. It should be changed to “uC/cm2”.

Idioma: Inglés

DOI: 10.3390/mi11020211

Año: 2020

Publicado en: MICROMACHINES 11, 2 (2020), 211 [1 pp.]
ISSN: 2072-666X

Factor impacto JCR: 2.891 (2020)

Categ. JCR: INSTRUMENTS & INSTRUMENTATION rank: 23 / 64 = 0.359 (2020) - Q2 - T2
Categ. JCR: PHYSICS, APPLIED rank: 69 / 160 = 0.431 (2020) - Q2 - T2
Categ. JCR: NANOSCIENCE & NANOTECHNOLOGY rank: 76 / 106 = 0.717 (2020) - Q3 - T3
Categ. JCR: CHEMISTRY, ANALYTICAL rank: 46 / 83 = 0.554 (2020) - Q3 - T2

Factor impacto SCIMAGO: 0.574 - Control and Systems Engineering (Q2) - Mechanical Engineering (Q2) - Electrical and Electronic Engineering (Q2)

Tipo y forma: (Published version)

Área (Departamento): Área Física Materia Condensada (Dpto. Física Materia Condensa.)