000102187 001__ 102187
000102187 005__ 20210526101120.0
000102187 0247_ $$2doi$$a10.1109/ACCESS.2021.3064190
000102187 0248_ $$2sideral$$a124165
000102187 037__ $$aART-2021-124165
000102187 041__ $$aeng
000102187 100__ $$aLlamazares Prieto, Álvaro$$uUniversidad de Zaragoza
000102187 245__ $$aCharacterization of parasitic impedance in PCB using a flexible test probe based on a curve-fitting method
000102187 260__ $$c2021
000102187 5060_ $$aAccess copy available to the general public$$fUnrestricted
000102187 5203_ $$aSwitching in power semiconductors with emerging materials such as silicon carbide (SiC) leads to undesired overvoltages and oscillations that limit switching frequency, largely due to impedance in the current commutation loop. Minimizing this parasitic impedance in printed circuit boards (PCB) requires precise characterization. To this end, this work presents a new measurement method based on obtaining S-parameters with a vector network analyzer (VNA) and on using a shielded flexible probe with mobile test terminals. The flexible probe uses a metal shielding plane perpendicular to the PCB to prevent the main measurement errors resulting from the variation in the magnetic flux responsible for loop inductance during the VNA frequency sweep. The proposed curve-fitting procedure consists of measuring the characteristic impedance and propagation time of the traces, considering they form ideal transmission lines. These values are used for a nonlinear least squares adjustment for the actual line (with losses). Finally, an experimental assembly with microstrip transmission lines was developed to validate the proposed method experimentally. The experimental results were compared with those obtained by using a rigid test fixture as a reference, those calculated analytically and those obtained from partial element equivalent circuit (PEEC) simulation. The curve-fitting method yields better results than the analytical and the simulation methods and they exhibit (up to 350 MHz) precisions of 1.37% in the characteristic impedance measurement and of 0.81% in the propagation time.
000102187 536__ $$9info:eu-repo/grantAgreement/EC/H2020/783158/EU/first and euRopEAn siC eigTh Inches pilOt liNe/REACTION$$9This project has received funding from the European Union’s Horizon 2020 research and innovation program under grant agreement No H2020 783158-REACTION
000102187 540__ $$9info:eu-repo/semantics/openAccess$$aby$$uhttp://creativecommons.org/licenses/by/3.0/es/
000102187 655_4 $$ainfo:eu-repo/semantics/article$$vinfo:eu-repo/semantics/publishedVersion
000102187 700__ $$0(orcid)0000-0002-5727-5705$$aGarcía-Gracia, Miguel$$uUniversidad de Zaragoza
000102187 700__ $$0(orcid)0000-0002-7008-7610$$aMartín-Arroyo, Susana$$uUniversidad de Zaragoza
000102187 7102_ $$15009$$2535$$aUniversidad de Zaragoza$$bDpto. Ingeniería Eléctrica$$cÁrea Ingeniería Eléctrica
000102187 773__ $$g9 (2021), 40695-40705$$pIEEE Access$$tIEEE Access$$x2169-3536
000102187 8564_ $$s1239573$$uhttps://zaguan.unizar.es/record/102187/files/texto_completo.pdf$$yVersión publicada
000102187 8564_ $$s2707886$$uhttps://zaguan.unizar.es/record/102187/files/texto_completo.jpg?subformat=icon$$xicon$$yVersión publicada
000102187 909CO $$ooai:zaguan.unizar.es:102187$$particulos$$pdriver
000102187 951__ $$a2021-05-26-08:05:27
000102187 980__ $$aARTICLE