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<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><dc:identifier>doi:10.1088/1361-6463/ac0ca5</dc:identifier><dc:language>eng</dc:language><dc:creator>Sangiao Barral, Soraya</dc:creator><dc:creator>Morales Aragonés, José Ignacio</dc:creator><dc:creator>Lucas del Pozo, Irene</dc:creator><dc:creator>Jiménez Cavero, Pilar</dc:creator><dc:creator>Morellón Alquézar, Luis</dc:creator><dc:creator>Sánchez Azqueta, Carlos</dc:creator><dc:creator>De Teresa Nogueras, José María</dc:creator><dc:title>Optimization of YIG/Bi stacks for spin-to-charge conversion and influence of aging</dc:title><dc:identifier>ART-2021-124562</dc:identifier><dc:description>We show that an optimized growth of magnetic layer/non-magnetic layer stacks allows for the improvement of the spin-to-charge conversion efficiency. From the analysis of the voltage signal generated in spin pumping experiments due to the inverse spin Hall effect (ISHE) on Y3Fe5O12 (YIG)/Bi stacks, we have determined values for the spin Hall angle and the spin-diffusion length in Bi of 0.0068(8) and 17.8(9) nm, respectively. Based on these results, we have also studied the
influence of aging on the spin-to-charge conversion efficiency by performing spin pumping experiments on YIG/Bi stacks after exposing the samples to ambient conditions for several days and up to 150 days. We have found that in YIG/Bi samples with Bi thicknesses around or below the spin-diffusion length, the ISHE voltage signal is still above 80% of its initial value after 100 days.</dc:description><dc:date>2021</dc:date><dc:source>http://zaguan.unizar.es/record/109374</dc:source><dc:doi>10.1088/1361-6463/ac0ca5</dc:doi><dc:identifier>http://zaguan.unizar.es/record/109374</dc:identifier><dc:identifier>oai:zaguan.unizar.es:109374</dc:identifier><dc:relation>info:eu-repo/grantAgreement/ES/DGA-FSE/E13-20R</dc:relation><dc:relation>info:eu-repo/grantAgreement/ES/MEC/FPU014-02546</dc:relation><dc:relation>info:eu-repo/grantAgreement/ES/MICINN/MAT2017-82970-C2-1-R</dc:relation><dc:relation>info:eu-repo/grantAgreement/ES/MICINN/MAT2017-82970-C2-2-R</dc:relation><dc:identifier.citation>JOURNAL OF PHYSICS D-APPLIED PHYSICS 54, 37 (2021), 375305 [7 pp.]</dc:identifier.citation><dc:rights>by-nc-nd</dc:rights><dc:rights>http://creativecommons.org/licenses/by-nc-nd/3.0/es/</dc:rights><dc:rights>info:eu-repo/semantics/openAccess</dc:rights></dc:dc>

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