<?xml version="1.0" encoding="UTF-8"?>
<xml>
<records>
<record>
  <contributors>
    <authors>
      <author>Berenschot, J.W.</author>
      <author>Tiggelaar, R. M.</author>
      <author>Geerlings, J.</author>
      <author>Gardeniers, J.G.E.</author>
      <author>Tas, N.R.</author>
      <author>Malankowska, M.</author>
      <author>Pina, M.P.</author>
      <author>Mallada, R.</author>
    </authors>
  </contributors>
  <titles>
    <title>3D-Fractal engineering based on oxide-only corner lithography</title>
    <secondary-title>Symp. Des. Test Integr. Packag. MEMS/MOEMS</secondary-title>
  </titles>
  <doi>10.1109/DTIP.2016.7514895</doi>
  <pages/>
  <volume/>
  <number/>
  <dates>
    <year>2016</year>
    <pub-dates>
      <date>2016</date>
    </pub-dates>
  </dates>
  <abstract/>
</record>

</records>
</xml>