000120228 001__ 120228 000120228 005__ 20240319081024.0 000120228 0247_ $$2doi$$a10.3390/electronics11213530 000120228 0248_ $$2sideral$$a131153 000120228 037__ $$aART-2022-131153 000120228 041__ $$aeng 000120228 100__ $$aKarami, Hamidreza 000120228 245__ $$aEMC Impact of Disturbances Generated by Multiple Sources 000120228 260__ $$c2022 000120228 5060_ $$aAccess copy available to the general public$$fUnrestricted 000120228 5203_ $$aIn this paper, the impact of an increasing number of arbitrary electrical/electronic devices on the overall radiated emissions is investigated. Understanding and quantifying such an impact are prerequisites to the proper evaluation of electromagnetic compatibility (EMC) of various electronic systems and devices and, if needed, to revisiting the international standards. To evaluate the radiated emissions from multiple electronic devices, each arbitrary electronic device is characterized using an equivalent Huygens’s surface, in which the tangential components of electric and magnetic near fields are calculated (or measured). The radiated emission from the arbitrary electronic device can be calculated using the electric and magnetic near fields for an arbitrary phase (correlated or uncorrelated), position, and orientation. The influence of several parameters affecting the radiated emissions from multiple arbitrary electronic devices, including the number of disturbance sources, the polarization of each device, the radiation pattern of each device, the location and orientation of each device, and the phase shifts between devices, are analyzed. The numerical results show that the mentioned parameters have a significant effect on the radiated emissions, and cannot be neglected in EMC considerations. In general, increasing the number of electronic devices leads to an increase in the level of radiated emissions. However, the increase depends on other parameters such as the arrangement (the radiation pattern for each device, the distance between the devices, and the orientation and/or polarization of each device). The proposed method can be straightforwardly applied to devices characterized by near-field measurements or multimodular large equipment with long cables. 000120228 540__ $$9info:eu-repo/semantics/openAccess$$aby$$uhttp://creativecommons.org/licenses/by/3.0/es/ 000120228 590__ $$a2.9$$b2022 000120228 592__ $$a0.628$$b2022 000120228 591__ $$aENGINEERING, ELECTRICAL & ELECTRONIC$$b131 / 274 = 0.478$$c2022$$dQ2$$eT2 000120228 591__ $$aPHYSICS, APPLIED$$b72 / 160 = 0.45$$c2022$$dQ2$$eT2 000120228 591__ $$aCOMPUTER SCIENCE, INFORMATION SYSTEMS$$b99 / 158 = 0.627$$c2022$$dQ3$$eT2 000120228 593__ $$aComputer Networks and Communications$$c2022$$dQ2 000120228 593__ $$aControl and Systems Engineering$$c2022$$dQ2 000120228 593__ $$aSignal Processing$$c2022$$dQ2 000120228 593__ $$aHardware and Architecture$$c2022$$dQ2 000120228 593__ $$aElectrical and Electronic Engineering$$c2022$$dQ2 000120228 594__ $$a4.7$$b2022 000120228 655_4 $$ainfo:eu-repo/semantics/article$$vinfo:eu-repo/semantics/publishedVersion 000120228 700__ $$aRubinstein, Marcos 000120228 700__ $$aRachidi, Farhad 000120228 700__ $$aPerrenoud, Christophe 000120228 700__ $$ade Raemy, Emmanuel 000120228 700__ $$aKraehenbuehl, Pascal 000120228 700__ $$0(orcid)0000-0002-4099-9918$$aMediano, Arturo$$uUniversidad de Zaragoza 000120228 7102_ $$15008$$2785$$aUniversidad de Zaragoza$$bDpto. Ingeniería Electrón.Com.$$cÁrea Tecnología Electrónica 000120228 773__ $$g11, 21 (2022), 3530 [23 pp.]$$pElectronics (Basel)$$tElectronics$$x2079-9292 000120228 8564_ $$s6934888$$uhttps://zaguan.unizar.es/record/120228/files/texto_completo.pdf$$yVersión publicada 000120228 8564_ $$s2710741$$uhttps://zaguan.unizar.es/record/120228/files/texto_completo.jpg?subformat=icon$$xicon$$yVersión publicada 000120228 909CO $$ooai:zaguan.unizar.es:120228$$particulos$$pdriver 000120228 951__ $$a2024-03-18-16:32:07 000120228 980__ $$aARTICLE