<?xml version="1.0" encoding="UTF-8"?>
<xml>
<records>
<record>
  <contributors>
    <authors>
      <author>Sampath, V.</author>
      <author>Maurtua, I.</author>
      <author>Aguilar Martin, J. J.</author>
      <author>Rivera, A.</author>
      <author>Molina, J.</author>
      <author>Gutiérrez, A.</author>
    </authors>
  </contributors>
  <titles>
    <title>Attention guided multi-task learning for surface defect identification</title>
    <secondary-title>IEEE Trans. Ind. Inform.</secondary-title>
  </titles>
  <doi>10.1109/TII.2023.3234030</doi>
  <pages/>
  <volume/>
  <number/>
  <dates>
    <year>2023</year>
    <pub-dates>
      <date>2023</date>
    </pub-dates>
  </dates>
  <abstract/>
</record>

</records>
</xml>