| Home > Articles > Long-term performance of magnetic force microscopy tips grown by focused electron beam induced deposition > MARC |
000125866 001__ 125866 000125866 005__ 20241125101203.0 000125866 0247_ $$2doi$$a10.3390/s23062879 000125866 0248_ $$2sideral$$a133375 000125866 037__ $$aART-2023-133375 000125866 041__ $$aeng 000125866 100__ $$aEscalante-Quiceno, Alix Tatiana 000125866 245__ $$aLong-term performance of magnetic force microscopy tips grown by focused electron beam induced deposition 000125866 260__ $$c2023 000125866 5060_ $$aAccess copy available to the general public$$fUnrestricted 000125866 5203_ $$aHigh-resolution micro- and nanostructures can be grown using Focused Electron Beam Induced Deposition (FEBID), a direct-write, resist-free nanolithography technology which allows additive patterning, typically with sub-100 nm lateral resolution, and down to 10 nm in optimal conditions. This technique has been used to grow magnetic tips for use in Magnetic Force Microscopy (MFM). Due to their high aspect ratio and good magnetic behavior, these FEBID magnetic tips provide several advantages over commercial magnetic tips when used for simultaneous topographical and magnetic measurements. Here, we report a study of the durability of these excellent candidates for high-resolution MFM measurements. A batch of FEBID-grown magnetic tips was subjected to a systematic analysis of MFM magnetic contrast for 30 weeks, using magnetic storage tape as a test specimen. Our results indicate that these FEBID magnetic tips operate effectively over a long period of time. The magnetic signal was well preserved, with a maximum reduction of 60% after 21 weeks of recurrent use. No significant contrast degradation was observed after 30 weeks in storage. 000125866 536__ $$9info:eu-repo/grantAgreement/ES/AEI/PDC2021-120852-C21$$9info:eu-repo/grantAgreement/ES/DGA/E13-20R 000125866 540__ $$9info:eu-repo/semantics/openAccess$$aby$$uhttp://creativecommons.org/licenses/by/3.0/es/ 000125866 590__ $$a3.4$$b2023 000125866 592__ $$a0.786$$b2023 000125866 591__ $$aCHEMISTRY, ANALYTICAL$$b34 / 106 = 0.321$$c2023$$dQ2$$eT1 000125866 593__ $$aInstrumentation$$c2023$$dQ1 000125866 591__ $$aINSTRUMENTS & INSTRUMENTATION$$b24 / 76 = 0.316$$c2023$$dQ2$$eT1 000125866 593__ $$aAnalytical Chemistry$$c2023$$dQ1 000125866 591__ $$aENGINEERING, ELECTRICAL & ELECTRONIC$$b122 / 353 = 0.346$$c2023$$dQ2$$eT2 000125866 593__ $$aAtomic and Molecular Physics, and Optics$$c2023$$dQ1 000125866 593__ $$aInformation Systems$$c2023$$dQ2 000125866 593__ $$aMedicine (miscellaneous)$$c2023$$dQ2 000125866 593__ $$aBiochemistry$$c2023$$dQ2 000125866 593__ $$aElectrical and Electronic Engineering$$c2023$$dQ2 000125866 594__ $$a7.3$$b2023 000125866 655_4 $$ainfo:eu-repo/semantics/article$$vinfo:eu-repo/semantics/publishedVersion 000125866 700__ $$aNovotný, Ondrej 000125866 700__ $$aNeuman, Jan 000125866 700__ $$0(orcid)0000-0002-6761-6171$$aMagén, César$$uUniversidad de Zaragoza 000125866 700__ $$0(orcid)0000-0001-9566-0738$$aDe Teresa, José María$$uUniversidad de Zaragoza 000125866 7102_ $$12003$$2395$$aUniversidad de Zaragoza$$bDpto. Física Materia Condensa.$$cÁrea Física Materia Condensada 000125866 773__ $$g23, 6 (2023), 2879 [11 pp.]$$pSensors$$tSensors$$x1424-8220 000125866 8564_ $$s4445340$$uhttps://zaguan.unizar.es/record/125866/files/texto_completo.pdf$$yVersión publicada 000125866 8564_ $$s2765540$$uhttps://zaguan.unizar.es/record/125866/files/texto_completo.jpg?subformat=icon$$xicon$$yVersión publicada 000125866 909CO $$ooai:zaguan.unizar.es:125866$$particulos$$pdriver 000125866 951__ $$a2024-11-22-12:12:42 000125866 980__ $$aARTICLE
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