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  <contributors>
    <authors>
      <author>Melios, Christos</author>
      <author>Huang, Nathaniel</author>
      <author>Callegaro, Luca</author>
      <author>Centeno, Alba</author>
      <author>Cultrera, Alessandro</author>
      <author>Cordón, Álvaro</author>
      <author>Panchal, Vishal</author>
      <author>Arnedo, Israel</author>
      <author>Redo-Sanchez, Albert</author>
      <author>Etayo, David</author>
      <author>Fernández, Montserrat</author>
      <author>López, Alex</author>
      <author>Rozhko, Sergiy</author>
      <author>Txoperena, Oihana</author>
      <author>Zurutuza, Amaia</author>
      <author>Kazakova, Olga</author>
    </authors>
  </contributors>
  <titles>
    <title>Towards standardisation of contact and contactless electrical measurements of CVD graphene at the macro-, micro- and nano-scale</title>
    <secondary-title>Sci. rep. (Nat. Publ. Group)</secondary-title>
  </titles>
  <doi>10.1038/s41598-020-59851-1</doi>
  <pages/>
  <volume/>
  <number/>
  <dates>
    <year>2020</year>
    <pub-dates>
      <date>2020</date>
    </pub-dates>
  </dates>
  <abstract/>
</record>

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