000128184 001__ 128184
000128184 005__ 20231127104407.0
000128184 0247_ $$2doi$$a10.1109/TIA.2021.3063993
000128184 0248_ $$2sideral$$a126631
000128184 037__ $$aART-2021-126631
000128184 041__ $$aeng
000128184 100__ $$aUmetani K.
000128184 245__ $$aAnalytical Formulation of Copper Loss of Litz Wire with Multiple Levels of Twisting Using Measurable Parameters
000128184 260__ $$c2021
000128184 5060_ $$aAccess copy available to the general public$$fUnrestricted
000128184 5203_ $$aLitz wire has been widely utilized in power transformers and inductors as a wire with low copper loss at high-frequency operation. The Litz wire is commonly made of many thin isolated strands twisted in multiple levels. Due to its complicated structure, the copper loss prediction of the Litz wire has been difficult, hindering the design optimization of the Litz wire structure. To overcome this difficulty, preceding studies have investigated the analytical copper loss models of the constituting elements of the Litz wire, i.e., the strands and the bundles of strands. The purpose of this article is to propose an analytical copper loss model of the Litz wire by utilizing these preceding knowledge. The proposed model is formulated only with parameters that can be measured by basic testing instruments. Besides, the proposed model considers the bundle structure of the Litz wire, which affects the local ac current distribution, and the twisting pitch, which causes the inclination of the Litz wire strands. The proposed model was tested by comparing the analytical prediction and experimental measurements of the ac resistance of commercially available Litz wires. As a result, the predicted ac resistance showed good agreement with the measured ac resistance, suggesting the appropriateness of the proposed model. © 1972-2012 IEEE.
000128184 540__ $$9info:eu-repo/semantics/openAccess$$aAll rights reserved$$uhttp://www.europeana.eu/rights/rr-f/
000128184 590__ $$a4.079$$b2021
000128184 591__ $$aENGINEERING, MULTIDISCIPLINARY$$b23 / 92 = 0.25$$c2021$$dQ1$$eT1
000128184 591__ $$aENGINEERING, ELECTRICAL & ELECTRONIC$$b89 / 274 = 0.325$$c2021$$dQ2$$eT1
000128184 592__ $$a1.983$$b2021
000128184 593__ $$aElectrical and Electronic Engineering$$c2021$$dQ1
000128184 593__ $$aControl and Systems Engineering$$c2021$$dQ1
000128184 594__ $$a9.7$$b2021
000128184 655_4 $$ainfo:eu-repo/semantics/article$$vinfo:eu-repo/semantics/acceptedVersion
000128184 700__ $$aKawahara S.
000128184 700__ $$0(orcid)0000-0001-7207-5536$$aAcero J.$$uUniversidad de Zaragoza
000128184 700__ $$0(orcid)0000-0001-8399-4650$$aSarnago H.$$uUniversidad de Zaragoza
000128184 700__ $$0(orcid)0000-0002-1284-9007$$aLucia O.$$uUniversidad de Zaragoza
000128184 700__ $$aHiraki E.
000128184 7102_ $$15008$$2785$$aUniversidad de Zaragoza$$bDpto. Ingeniería Electrón.Com.$$cÁrea Tecnología Electrónica
000128184 773__ $$g57, 3 (2021), 2407-2420$$pIEEE trans. ind. appl.$$tIEEE Transactions on Industry Applications$$x0093-9994
000128184 8564_ $$s463558$$uhttps://zaguan.unizar.es/record/128184/files/texto_completo.pdf$$yPostprint
000128184 8564_ $$s3024535$$uhttps://zaguan.unizar.es/record/128184/files/texto_completo.jpg?subformat=icon$$xicon$$yPostprint
000128184 909CO $$ooai:zaguan.unizar.es:128184$$particulos$$pdriver
000128184 951__ $$a2023-11-27-09:26:35
000128184 980__ $$aARTICLE