| Accueil > tesis > Deep Learning Algorithms in Industry 4.0; Application of Surface defect inspection for quality control > BibTeX |
@article{MaurtuaOrmaetxea:129982,
author = "Sampath, Vignesh and Maurtua Ormaetxea, Iñaki and
Aguilar Martín, Juan José ",
title = "{}",
year = "2023",
note = "Presentado: 11 07 2023",
}