000132267 001__ 132267
000132267 005__ 20240301161207.0
000132267 0247_ $$2doi$$a10.1021/acsami.3c16407
000132267 0248_ $$2sideral$$a137429
000132267 037__ $$aART-2024-137429
000132267 041__ $$aeng
000132267 100__ $$aAllen, Frances I.
000132267 245__ $$aFocused Helium Ion and Electron Beam-Induced Deposition of Organometallic Tips for Dynamic Atomic Force Microscopy of Biomolecules in Liquid
000132267 260__ $$c2024
000132267 5060_ $$aAccess copy available to the general public$$fUnrestricted
000132267 5203_ $$aWe demonstrate the fabrication of sharp nanopillars of high aspect ratio onto specialized atomic force microscopy (AFM) microcantilevers and their use for high-speed AFM of DNA and nucleoproteins in liquid. The fabrication technique uses localized charged-particle-induced deposition with either a focused beam of helium ions or electrons in a helium ion microscope (HIM) or scanning electron microscope (SEM). This approach enables customized growth onto delicate substrates with nanometer-scale placement precision and in situ imaging of the final tip structures using the HIM or SEM. Tip radii of <10 nm are obtained and the underlying microcantilever remains intact. Instead of the more commonly used organic precursors employed for bio-AFM applications, we use an organometallic precursor (tungsten hexacarbonyl) resulting in tungsten-containing tips. Transmission electron microscopy reveals a thin layer of carbon on the tips. The interaction of the new tips with biological specimens is therefore likely very similar to that of standard carbonaceous tips, with the added benefit of robustness. A further advantage of the organometallic tips is that compared to carbonaceous tips they better withstand UV–ozone cleaning treatments to remove residual organic contaminants between experiments, which are inevitable during the scanning of soft biomolecules in liquid. Our tips can also be grown onto the blunted tips of previously used cantilevers, thus providing a means to recycle specialized cantilevers and restore their performance to the original manufacturer specifications. Finally, a focused helium ion beam milling technique to reduce the tip radii and thus further improve lateral spatial resolution in the AFM scans is demonstrated.
000132267 536__ $$9info:eu-repo/grantAgreement/ES/AEI/PDC2021-120852-C21$$9info:eu-repo/grantAgreement/ES/DGA/E13-23R$$9info:eu-repo/grantAgreement/ES/MICINN-AEI/PID2020-112914RB-100/AEI/10.13039/501100011033
000132267 540__ $$9info:eu-repo/semantics/openAccess$$aby-nc-nd$$uhttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
000132267 655_4 $$ainfo:eu-repo/semantics/article$$vinfo:eu-repo/semantics/acceptedVersion
000132267 700__ $$0(orcid)0000-0001-9566-0738$$aDe Teresa, José María
000132267 700__ $$aOnoa, Bibiana
000132267 773__ $$g16, 4 (2024), 4439-4448$$pACS appl. mater. interfaces$$tACS applied materials & interfaces$$x1944-8244
000132267 8564_ $$s8224462$$uhttps://zaguan.unizar.es/record/132267/files/texto_completo.pdf$$yPostprint$$zinfo:eu-repo/date/embargoEnd/2025-01-20
000132267 8564_ $$s2092637$$uhttps://zaguan.unizar.es/record/132267/files/texto_completo.jpg?subformat=icon$$xicon$$yPostprint$$zinfo:eu-repo/date/embargoEnd/2025-01-20
000132267 909CO $$ooai:zaguan.unizar.es:132267$$particulos$$pdriver
000132267 951__ $$a2024-03-01-14:53:36
000132267 980__ $$aARTICLE