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Characterization of 65-nm CMOS Integrated Resistors in the Cryogenic Regime
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Characterization of 65-nm CMOS Integrated Resistors in the Cryogenic Regime
-
Marqués-García, Jorge
et al
- ART-2024-138350
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03 May 2024, 12:03
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texto_completo.pdf
[3.63 MB]
03 May 2024, 12:03
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