000145256 001__ 145256
000145256 005__ 20241015122513.0
000145256 0247_ $$2doi$$a10.1002/pssb.201900126
000145256 0248_ $$2sideral$$a140064
000145256 037__ $$aART-2019-140064
000145256 041__ $$aeng
000145256 100__ $$0(orcid)0000-0001-6040-1920$$aJuarez-Perez, Emilio J.$$uUniversidad de Zaragoza
000145256 245__ $$aDetermination of Carrier Diffusion Length Using Transient Electron Photoemission Microscopy in the GaAs/InSe Heterojunction
000145256 260__ $$c2019
000145256 5060_ $$aAccess copy available to the general public$$fUnrestricted
000145256 5203_ $$aCarrier diffusion length and lifetime parameters for electron transport at nanoscale semiconductor slabs have been fitted using a 1D model and the decay data extracted from transient photoemission electron microscopy. Meanwhile, a conventional photoluminescence quenching measurement needs two separate samples with an active material between blocking and quenching layers to characterize the carrier transport properties. In this work, only one few‐layer monocrystalline sample of γ‐InSe containing different thicknesses of active material is used to obtain a common diffusion coefficient consistent with previously reported values for vertical carrier diffusion in layered InSe.
000145256 540__ $$9info:eu-repo/semantics/openAccess$$aAll rights reserved$$uhttp://www.europeana.eu/rights/rr-f/
000145256 590__ $$a1.481$$b2019
000145256 591__ $$aPHYSICS, CONDENSED MATTER$$b48 / 69 = 0.696$$c2019$$dQ3$$eT3
000145256 592__ $$a0.504$$b2019
000145256 593__ $$aCondensed Matter Physics$$c2019$$dQ2
000145256 593__ $$aElectronic, Optical and Magnetic Materials$$c2019$$dQ2
000145256 655_4 $$ainfo:eu-repo/semantics/article$$vinfo:eu-repo/semantics/acceptedVersion
000145256 700__ $$aQi, Yabing
000145256 7102_ $$15005$$2555$$aUniversidad de Zaragoza$$bDpto. Ing.Quím.Tecnol.Med.Amb.$$cÁrea Ingeniería Química
000145256 773__ $$g256, 10 (2019), 1900126 [6 pp.]$$pPhys. status solidi, B Basic res.$$tPHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS$$x0370-1972
000145256 8564_ $$s3598140$$uhttps://zaguan.unizar.es/record/145256/files/texto_completo.pdf$$yPostprint
000145256 8564_ $$s2407175$$uhttps://zaguan.unizar.es/record/145256/files/texto_completo.jpg?subformat=icon$$xicon$$yPostprint
000145256 909CO $$ooai:zaguan.unizar.es:145256$$particulos$$pdriver
000145256 951__ $$a2024-10-15-10:50:59
000145256 980__ $$aARTICLE