Repositorio Institucional de Documentos

@article{Juarez-Perez:145256,
      author        = "Juarez-Perez, Emilio J. and Qi, Yabing",
      title         = "{Determination of Carrier Diffusion Length Using Transient
                       Electron Photoemission Microscopy in the GaAs/InSe
                       Heterojunction}",
      year          = "2019",
}