Koutsogiannis, Panagiotis Risch, Felix Pardo, José A. Stolichnov, Igor Magén, César Atomic-Scale Characterization of 180° Conductive Domain Walls in PbZr<sub>0.1</sub>Ti<sub>0.9</sub>O<sub>3</sub> ACS appl. mater. interfaces 10.1021/acsami.4c11565 2024 2024