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<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><dc:identifier>doi:10.1109/SMACD61181.2024.10745457</dc:identifier><dc:language>eng</dc:language><dc:creator>Aznar, Francisco</dc:creator><dc:creator>Esteban-Eraso, Uxua</dc:creator><dc:creator>Perez-Martinez, Antonio D.</dc:creator><dc:creator>Celma, Santiago</dc:creator><dc:title>A New Metric Measuring Steering Accuracy of Digitally Controlled Phase Shifters</dc:title><dc:identifier>ART-2024-142033</dc:identifier><dc:description>This paper proposes a new metric to compare digitally controlled phase shifters, denoted as Beam Steering Error (BSE). The definition of BSE is introduced by an example of a 2-bit phase shifter, and it is compared to the traditionally used RMS phase error. The advantages during simulation stage of using this new indicator are shown for a real case of a 4-bit phase shifter designed in a 65−nm CMOS process.</dc:description><dc:date>2024</dc:date><dc:source>http://zaguan.unizar.es/record/149913</dc:source><dc:doi>10.1109/SMACD61181.2024.10745457</dc:doi><dc:identifier>http://zaguan.unizar.es/record/149913</dc:identifier><dc:identifier>oai:zaguan.unizar.es:149913</dc:identifier><dc:relation>info:eu-repo/grantAgreement/ES/AEI/PID2020-114110RA-I00</dc:relation><dc:relation>info:eu-repo/grantAgreement/ES/DGA/LMP197-21</dc:relation><dc:identifier.citation>International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design 20 (2024), 1-4</dc:identifier.citation><dc:rights>All rights reserved</dc:rights><dc:rights>http://www.europeana.eu/rights/rr-f/</dc:rights><dc:rights>info:eu-repo/semantics/embargoedAccess</dc:rights></dc:dc>

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