164083 20251121161351.0 doi 10.1016/j.aca.2025.344694 sideral 146254 ART-2025-146254 eng Bazo, Antonio Universidad de Zaragoza Improving detection and figures of merit in single-particle inductively coupled plasma-mass spectrometry via transient event heights 2025 Background: Single-particle inductively coupled plasma-mass spectrometry (SP-ICP-MS) is a powerful method for characterizing micro- and nanoparticulate materials. The technique primarily relies on the linear relationship between the integrated intensities of individual events (peak areas) and the analyte mass, though transit times (peak widths) have also been used for quantitative purposes. This work (1) evaluates the potential of using peak heights as analytical signals in SP-ICP-MS, (2) introduces a new method for determining peak heights, and (3) explores scenarios in which peak height offers added value over the commonly used SP-ICP-MS signals. Results: A new method was proposed to estimate peak height values in SP-ICP-MS accurately. The cumulative intensity across consecutive dwell times was modeled using a third-degree polynomial, from which the adjusted peak height was derived. This approach reduces the uncertainty associated with using raw maximum intensity values, yielding NP distributions comparable to those obtained via integrated intensities. The effect of dwell time on peak height was also evaluated. An optimal range (50 μs–200 μs) was identified, where a linear relationship was observed between the peak height and the square of the NP diameter. Within this range, peak height showed the lowest bias when characterizing smaller NPs, indicating the potential to improve the limit of quantification (LoQ). Additionally, peak heights proved helpful in determining the limit of detection (LoD) and setting appropriate threshold values for data processing, thereby helping to flag incorrect resultsand addressing a challenge in SP-ICP-MS analysis. Significance: This is the first study to evaluate peak height as an analytical signal in SP-ICP-MS. The results highlight its advantages in specific applications, such as sizing NPs near the LoD, and in supporting the more reliable use of other signals, such as peak areas, by helping to identify incorrect threshold selection that could lead to biased distributions. Finally, monitoring peak heights allows for a more realistic and assumption-free determination of the LoD. Access copy available to the general public Unrestricted info:eu-repo/grantAgreement/ES/DGA/E43-20R info:eu-repo/grantAgreement/ES/DGA/PROY_E17_24 info:eu-repo/grantAgreement/ES/DGA/T58-23R info:eu-repo/grantAgreement/EC/H2020/101034288/EU/International Fellowship Programme for Talent Attraction to the Campus of International Excellence Campus Iberus/IberusExperience This project has received funding from the European Union’s Horizon 2020 research and innovation program under grant agreement No H2020 101034288-IberusExperience info:eu-repo/grantAgreement/ES/MICINN/PID2021-122455NB-I00 info:eu-repo/grantAgreement/ES/MICINN/PID2022-136454NB-C22 info:eu-repo/grantAgreement/ES/MICINN/RYC2021-031093-I info:eu-repo/semantics/openAccess by-nc-nd https://creativecommons.org/licenses/by-nc-nd/4.0/deed.es info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion López-Villellas, Lorién Universidad de Zaragoza (orcid)0000-0002-1891-4359 Mataloni, Matilde Bolea-Fernandez, Eduardo Rua-Ibarz, Ana Grotti, Marco Aramendía, Maite Universidad de Zaragoza (orcid)0000-0002-3916-9992 Resano, Martín Universidad de Zaragoza (orcid)0000-0002-7450-8769 2009 750 Universidad de Zaragoza Dpto. Química Analítica Área Química Analítica 5007 035 Universidad de Zaragoza Dpto. Informát.Ingenie.Sistms. Área Arquit.Tecnología Comput. 1378 (2025), 344694 [10 pp.] Anal. chim. acta Analytica Chimica Acta 0003-2670 4629050 http://zaguan.unizar.es/record/164083/files/texto_completo.pdf Versión publicada 1802055 http://zaguan.unizar.es/record/164083/files/texto_completo.jpg?subformat=icon icon Versión publicada oai:zaguan.unizar.es:164083 articulos driver 2025-11-21-14:26:08 ARTICLE