000165589 001__ 165589
000165589 005__ 20260113221445.0
000165589 0247_ $$2doi$$a10.1039/d5ja90048d
000165589 0248_ $$2sideral$$a147280
000165589 037__ $$aART-2025-147280
000165589 041__ $$aeng
000165589 100__ $$aAgarwal, Ayush
000165589 245__ $$aAtomic spectrometry update: review of advances in the analysis of metals, chemicals and functional materials
000165589 260__ $$c2025
000165589 5060_ $$aAccess copy available to the general public$$fUnrestricted
000165589 5203_ $$aThis update covers the literature published between approximately June 2024 and April 2025 and is the latest part of a series of annual reviews. It is designed to provide the reader with an overview of the current state of the art with respect to the atomic spectrometric analysis of various metals, polymers, electronic, nano and other materials. Data processing continues to be the major focus for LIBS and TOF-SIMS analyses, mainly to provide reliable analyte quantification data. A variety of machine learning algorithms and statistical approaches have been used for this, often in multiple steps. Although these algorithms have been used for some years, their use is expanding into new areas. Another development is the combination of complementary techniques on the same instrument platform. This enables data from the two techniques to be obtained simultaneously and from the same spot on the sample. The analysis of polymers and nanomaterials continues to develop, with the prominent platforms used being SP-ICP-MS, SP-ICP-TOF-MS and X-ray based techniques. In addition, efforts are now being accelerated to produce nanomaterial CRMs and RMs, the lack of which has hampered truly robust method validation. For electronic materials XPS, GIXRF, GEXRF and TOF-SIMS remain dominant for surface and depth profiling, whilst for bulk composition LIBS, ICP-MS, and XRF remain prominent. Work in this area is also focussing on the development of advanced sample preparation and microextraction approaches that expand the scope of laser-based spectroscopy.
000165589 540__ $$9info:eu-repo/semantics/embargoedAccess$$aAll rights reserved$$uhttp://www.europeana.eu/rights/rr-f/
000165589 655_4 $$ainfo:eu-repo/semantics/article$$vinfo:eu-repo/semantics/acceptedVersion
000165589 700__ $$0(orcid)0000-0002-1856-2058$$aBolea-Fernandez, Eduardo$$uUniversidad de Zaragoza
000165589 700__ $$aClough, Robert
000165589 700__ $$aFisher, Andy
000165589 700__ $$aGibson, Bridget
000165589 700__ $$aHill, Steve
000165589 7102_ $$12009$$2750$$aUniversidad de Zaragoza$$bDpto. Química Analítica$$cÁrea Química Analítica
000165589 773__ $$g40, 11 (2025), 2982-3022$$pJ. anal. at. spectrom.$$tJournal of Analytical Atomic Spectrometry$$x0267-9477
000165589 8564_ $$s783348$$uhttps://zaguan.unizar.es/record/165589/files/texto_completo.pdf$$yPostprint$$zinfo:eu-repo/date/embargoEnd/2026-10-09
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000165589 909CO $$ooai:zaguan.unizar.es:165589$$particulos$$pdriver
000165589 951__ $$a2026-01-13-22:10:46
000165589 980__ $$aARTICLE