Effect of Cryogenic Thermal Stress Cycles on the Performance of Integrated Resistors

Esquíroz-Olloqui, Yago Pérez-Bailón, Jorge Celma, Santiago Sánchez-Azqueta, Carlos Effect of Cryogenic Thermal Stress Cycles on the Performance of Integrated Resistors

IEEE trans. instrum. meas.

10.1109/TIM.2026.3655943 2026

2026