170003 20260316092629.0 doi 10.1088/2053-1583/ae2ca1 sideral 148561 ART-2025-148561 eng Tillotson, Evan A large interlaboratory electron diffraction study of monolayer graphene 2025 Standardisation of data collection and analysis is essential to enable commercialisation of 2D materials in a wide range of technologies. Selected area electron diffraction (SAED) in the transmission electron microscope (TEM) is one of the key methods for distinguishing monolayer from bilayer and few-layer graphene by comparing the 1st and 2nd order diffraction spot intensities. Yet there are many factors that can affect the reliability of data collection and interpretation, causing the measurement of monolayer samples to deviate from the literature boundary condition of I-{2 & strns;110}/I-{11 & strns;00}< 1 for monolayer graphene (1LG). Here we present the results of a large interlaboratory SAED comparison study, where 15 international laboratories measured and analysed nominally identical samples of chemical vapour deposited graphene. Large variations were observed in the measured ratios of diffraction spot intensities, with the largest variance associated with poor quality SAED data resulting from inadequate specimen handling and storage. To inform the reliable determination of monolayer thickness from SAED patterns we provide a description of best practice for specimen handling, TEM operation, data collection and analysis. This work was undertaken within VAMAS Technical Working Area 41: Graphene and related 2D materials-Project 9, the results of which have been directly incorporated into ISO/TS 21356-2 for the characterisation of graphene sheets. We find that when this methodology is followed, 1LG can be distinguished from bilayer or thicker material with high confidence where analysis of a single SAED pattern gives I-{2 & strns;110}/I-{11 & strns;00}< 1.2, even in the absence of precise specimen tilting. Access copy available to the general public Unrestricted info:eu-repo/grantAgreement/ES/DGA/E13-23R info:eu-repo/grantAgreement/ES/MICIU/CEX2023-001286-S info:eu-repo/grantAgreement/ES/MICIU/PID2023-151080NB-I00 info:eu-repo/grantAgreement/ES/MICIU/PRTR-C17.I1 info:eu-repo/semantics/openAccess by https://creativecommons.org/licenses/by/4.0/deed.es info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion Thornley, William Talbott, William Eggeman, Alexander S Kriuchkova, Daria Sullivan-Allsop, Sam Smith, Matt Liu, Xuzhao Slattery, Ashley Yap, Pei Lay Losic, Dusan Xu, Zhun Wang, Huan Ciston, Jim Rakowski, Alexander Ribet, Stephanie M Savitzky, Benjamin H Schuster, Manfred E Allen, Christopher S Douglas-Henry, Danielle Nicolosi, Valeria Herzing, Andrew O’Connell, Jacques Olivier, Ezra J Neethling, Jan Zou, Yi-Chao Duran, Ercin Cai, Rongsheng Ngo, Duc-The Gorbachev, Roman Haas, Jonas Schlegel, Michael Meyer, Jannik Centeno, Alba Pesquera, Amaia Zurutuza, Amaia Kang, Sungsu Park, Jungwon Erofeev, Ivan Mirsaidov, Utkur Ophus, Colin Rentenberger, Christian Waitz, Thomas Kotakoski, Jani Roy, Abhijit Universidad de Zaragoza Arenal, Raul (orcid)0000-0002-2071-9093 Pollard, Andrew J Haigh, Sarah J 2003 395 Universidad de Zaragoza Dpto. Física Materia Condensa. Área Física Materia Condensada 13, 2 (2025), 025007 [17 pp.] 2D materials. 2D MATERIALS 2053-1583 The data that support the findings of this study will be openly available following an embargo at the following URL/DOI https://zenodo.org/records/15639586 Supplementary Information available at http:// doi.org/10.1088/2053-1583/ae2ca1/data1 Video 1- line profile alignment – thin line available at http://doi.org/10.1088/2053-1583/ae2ca1/ data2 Video 2- line profile alignment – thick line available at http://doi.org/10.1088/2053-1583/ae2ca1/ data3 3361965 http://zaguan.unizar.es/record/170003/files/texto_completo.pdf Versión publicada 604353 http://zaguan.unizar.es/record/170003/files/texto_completo.jpg?subformat=icon icon Versión publicada oai:zaguan.unizar.es:170003 articulos driver 2026-03-16-08:16:38 ARTICLE