Página principal > Caracterización II: Microscopias avanzadas |
GDOC-2014-2912 |
Curso: 2014-2015
Universidad de Zaragoza,
Zaragoza
Titulación: Máster Universitario en Materiales Nanoestructurados para Aplicaciones Nanotecnológicas
Idioma: Español
Profesor(es): Arnaudas Pontaque, José Ignacio ; Martín Solans, Santiago ; Magén Domínguez, Cesar ; Serrate Donoso, David
Resumen: LA ASIGNATURA SE IMPARTE EN INGLES Y LA GUIA DOCENTE SE PROPORCIONA SOLO EN ESE IDIOMA. THIS MODULE IS TAUGHT IN ENGLISH. INFORMATION IS ONLY AVAILABLE IN THIS LANGUAGE. PLEASE, GO TO THE ENGLISH VERSION.
Abstract: This subject will show the student the advanced microscopes (electronic, dual-beam and scanning probe) that allow the morphology and topography of nanostructured materials to be studied with nanometric resolution in addition to being powerful analytical tools, determining electric and magnetic properties at the molecular scale and allowing the handling of the substance at atomic and molecular scale. A brief description of the contents of this subject includes: Introduction to electron and scanning probe microscopy. Scanning electron microscopy. Transmission electron microscopy (image and diffraction). Analysis techniques linked to electron microscopy: energy dispersive X-ray spectroscopy and electron energy loss spectroscopy. Atomic and magnetic force microscopy. Scanning tunnelling microscopy. Surface spectroscopy. Other advanced optical microscopes: confocal and near-field. The theory classes are complemented by practical sessions including: 1.- SEM 2.- TEM 3.- SPM
Este registro pertenece a las colecciones:
Materiales académicos > Guías docentes > Ciencias > Masteres de Ciencias > Máster Universitario en Materiales Nanoestructurados para Aplicaciones Nanotecnológicas
Materiales académicos > Guías docentes > Guías docentes: Curso 2014-2015