EELS measurements in single wall Boron Nitride nanotubes

Arenal, R. ; Stephan, O. ; Kociak, M. ; Taverna, D. ; Colliex, C. ; Rubio, A. ; Loiseau, A.

Resumen: We present here the results of an electron energy loss spectroscopy (EELS) study in scanning transmission electron microscopy (STEM) on boron nitride nanotubes (BN-NTs). The low and core-loss regions have been analyzed to provide by the same technique a combined information about chemical bonding in the different materials in the sample and the electronic properties of individual BN-NTs. In particular, we deduce an optical gap value of about 5.8 eV for single walled nanotubes, which is independent on diameter.

Idioma: Inglés

DOI: 10.1063/1.1812093

Año: 2004

Publicado en: AIP conference proceedings 723, 1 (2004), 293-297
ISSN: 0094-243X

Tipo y forma: Artículo (Versión definitiva)