Resumen: The aim of this project is to analyze locally the residual stress of a polymer-matrix composite of industrial relevance by using a novel focused ion beam (FIB) method. The project approach is to solve the problem of the analysis of a polymeric base material displaying high electrical resistivity, since the focused ion beam (FIB) microscope is nowadays only useful for conductive materials. Based on the results obtained future possible uses are determined in the biomedical field, such as: intramedullary nails, bone plates, screws, rods, etc.