000074857 001__ 74857
000074857 005__ 20231127095530.0
000074857 0247_ $$2doi$$a10.1039/c7ja00138j
000074857 0248_ $$2sideral$$a103590
000074857 037__ $$aART-2017-103590
000074857 041__ $$aeng
000074857 100__ $$0(orcid)0000-0002-1856-2058$$aBolea-Fernandez, E.
000074857 245__ $$aCharacterization of SiO2 nanoparticles by single particle-inductively coupled plasma-tandem mass spectrometry (SP-ICP-MS/MS)
000074857 260__ $$c2017
000074857 5060_ $$aAccess copy available to the general public$$fUnrestricted
000074857 5203_ $$aThe increase in the use of SiO2 nanoparticles (NPs) is raising concern about their environmental and health effects, thus necessitating the development of novel methods for their straightforward detection and characterization. Single particle ICP-mass spectrometry (SP-ICP-MS) is able to provide information on the size of NPs, their particle number density and mass concentration. However, the determination of Si via ICP-MS is strongly hampered by the occurrence of spectral overlap from polyatomic species (e.g., CO+ and N2+). The use of tandem ICP-MS (ICP-MS/MS) enables interference-free conditions to be obtained, even in the most demanding applications. Upon testing several gases, the use of CH3F (monitoring of SiF+, mass-shift approach) and of H2 (monitoring of Si+, on-mass approach) were demonstrated to be the most suitable to overcome the spectral interference affecting ultra-trace Si determination (LoD < 15 ng L-1). By using these approaches, SiO2 NPs (ranging between 80 and 400 nm) can be detected and characterized. For SiO2 NPs > 100 nm, it was possible to provide accurate results in a straightforward way, as the signals they give rise to are well resolved from those of the background. In the case of 80 and 100 nm NPs, the use of a simple deconvolution approach following a Gaussian model was needed to characterize SiO2 NPs apparently showing incomplete distributions as a result of the presence of the background signal. Overall, the methods developed using SP-ICP-MS/MS are sensitive and selective enough for the interference-free determination of Si at ultra-trace levels, also in the form of SiO2 NPs.
000074857 536__ $$9info:eu-repo/grantAgreement/ES/MINECO/CTQ2015-64684-P
000074857 540__ $$9info:eu-repo/semantics/openAccess$$aby-nc-nd$$uhttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
000074857 590__ $$a3.608$$b2017
000074857 591__ $$aSPECTROSCOPY$$b4 / 42 = 0.095$$c2017$$dQ1$$eT1
000074857 591__ $$aCHEMISTRY, ANALYTICAL$$b13 / 78 = 0.167$$c2017$$dQ1$$eT1
000074857 592__ $$a1.066$$b2017
000074857 593__ $$aSpectroscopy$$c2017$$dQ1
000074857 593__ $$aAnalytical Chemistry$$c2017$$dQ1
000074857 655_4 $$ainfo:eu-repo/semantics/article$$vinfo:eu-repo/semantics/acceptedVersion
000074857 700__ $$aLeite, D.
000074857 700__ $$0(orcid)0000-0001-9582-6283$$aRua-Ibarz, A.
000074857 700__ $$aBalcaen, L.
000074857 700__ $$0(orcid)0000-0002-3916-9992$$aAramendía, M.
000074857 700__ $$0(orcid)0000-0002-7450-8769$$aResano, M.$$uUniversidad de Zaragoza
000074857 700__ $$aVanhaecke, F.
000074857 7102_ $$12009$$2750$$aUniversidad de Zaragoza$$bDpto. Química Analítica$$cÁrea Química Analítica
000074857 773__ $$g32, 11 (2017), 2140-2152$$pJ. anal. at. spectrom.$$tJournal of Analytical Atomic Spectrometry$$x0267-9477
000074857 8564_ $$s607911$$uhttps://zaguan.unizar.es/record/74857/files/texto_completo.pdf$$yPostprint
000074857 8564_ $$s38250$$uhttps://zaguan.unizar.es/record/74857/files/texto_completo.jpg?subformat=icon$$xicon$$yPostprint
000074857 909CO $$ooai:zaguan.unizar.es:74857$$particulos$$pdriver
000074857 951__ $$a2023-11-27-09:46:29
000074857 980__ $$aARTICLE