000086219 001__ 86219
000086219 005__ 20200716101438.0
000086219 0247_ $$2doi$$a10.1016/j.measurement.2018.11.082
000086219 0248_ $$2sideral$$a109698
000086219 037__ $$aART-2019-109698
000086219 041__ $$aeng
000086219 100__ $$aPerez-Diaz-de-Cerio, D.
000086219 245__ $$aLow-cost test measurement setup for real IoT BLE sensor device characterization
000086219 260__ $$c2019
000086219 5060_ $$aAccess copy available to the general public$$fUnrestricted
000086219 5203_ $$aThe methodology presented in this paper aims to characterize impairments shown by real devices which are usually neglected on standardized tests but that become very important in massive IoT scenarios. For instance, we have measured that real BLE scanners are not able to scan continuously even though they are configured to do so. Besides, we have also found and demonstrated that some manufacturers seem not to apply any backoff mechanism although it is mandatory. These two unexpected behaviors have a significant impact on the performance of massive wireless sensor networks based on BLE. So, it becomes necessary to characterize these and other impairments. The proposed tests are based on device current consumption measurements and their association with the information obtained from upper layers. We describe a new low-cost generic measurement setup and provide all the necessary data (configuration parameters, scripts, etc.) for applying the proposed methodology. As an example, we use it to profile the behavior of Bluetooth Low Energy devices. Furthermore, the proposed setup can also inspire researchers to characterize other wireless technology devices, like Wi-Fi, Zigbee, LoRa, etc.
000086219 536__ $$9info:eu-repo/grantAgreement/ES/DGA/T31-17R$$9info:eu-repo/grantAgreement/ES/MINECO/RTI2018-099880-B-C32$$9info:eu-repo/grantAgreement/ES/MINECO/TEC2014-58341-C4-2-R$$9info:eu-repo/grantAgreement/ES/MINECO/TEC2014-60258-C2-2-R
000086219 540__ $$9info:eu-repo/semantics/openAccess$$aby-nc-nd$$uhttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
000086219 590__ $$a3.364$$b2019
000086219 592__ $$a0.367$$b2019
000086219 591__ $$aENGINEERING, MULTIDISCIPLINARY$$b22 / 91 = 0.242$$c2019$$dQ1$$eT1
000086219 593__ $$aApplied Mathematics$$c2019$$dQ2
000086219 591__ $$aINSTRUMENTS & INSTRUMENTATION$$b13 / 64 = 0.203$$c2019$$dQ1$$eT1
000086219 593__ $$aStatistics and Probability$$c2019$$dQ2
000086219 593__ $$aEducation$$c2019$$dQ2
000086219 593__ $$aCondensed Matter Physics$$c2019$$dQ2
000086219 655_4 $$ainfo:eu-repo/semantics/article$$vinfo:eu-repo/semantics/acceptedVersion
000086219 700__ $$0(orcid)0000-0002-0299-0859$$aHernández-Solana, Á.$$uUniversidad de Zaragoza
000086219 700__ $$0(orcid)0000-0003-2664-6339$$aValdovinos, A.$$uUniversidad de Zaragoza
000086219 700__ $$aOlmos, J.
000086219 700__ $$aValenzuela, J.L.
000086219 7102_ $$15008$$2560$$aUniversidad de Zaragoza$$bDpto. Ingeniería Electrón.Com.$$cÁrea Ingeniería Telemática
000086219 773__ $$g135 (2019), 814-827$$pMeasurement$$tMEASUREMENT$$x0263-2241
000086219 8564_ $$s1667884$$uhttps://zaguan.unizar.es/record/86219/files/texto_completo.pdf$$yPostprint
000086219 8564_ $$s192832$$uhttps://zaguan.unizar.es/record/86219/files/texto_completo.jpg?subformat=icon$$xicon$$yPostprint
000086219 909CO $$ooai:zaguan.unizar.es:86219$$particulos$$pdriver
000086219 951__ $$a2020-07-16-08:57:12
000086219 980__ $$aARTICLE