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<dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:invenio="http://invenio-software.org/elements/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><dc:identifier>doi:10.3390/mi11020211</dc:identifier><dc:language>eng</dc:language><dc:creator>De Teresa, José María</dc:creator><dc:creator>Orús, Pablo</dc:creator><dc:creator>Cordoba, Rosa</dc:creator><dc:creator>Philipp, Patrick</dc:creator><dc:title>Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799</dc:title><dc:identifier>ART-2020-117537</dc:identifier><dc:description>Erratum of Micromachines 2019, 10(12), 799: In Section 3.1 (page 4) on the fourth line, it says “C/cm2”. It should be changed to “uC/cm2”.</dc:description><dc:date>2020</dc:date><dc:source>http://zaguan.unizar.es/record/89273</dc:source><dc:doi>10.3390/mi11020211</dc:doi><dc:identifier>http://zaguan.unizar.es/record/89273</dc:identifier><dc:identifier>oai:zaguan.unizar.es:89273</dc:identifier><dc:identifier.citation>MICROMACHINES 11, 2 (2020), 211 [1 pp.]</dc:identifier.citation><dc:rights>by</dc:rights><dc:rights>http://creativecommons.org/licenses/by/3.0/es/</dc:rights><dc:rights>info:eu-repo/semantics/openAccess</dc:rights></dc:dc>

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