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000095473 005__ 20210902121729.0
000095473 0247_ $$2doi$$a10.1016/j.ultramic.2020.113086
000095473 0248_ $$2sideral$$a119527
000095473 037__ $$aART-2020-119527
000095473 041__ $$aeng
000095473 100__ $$aObermair, M.
000095473 245__ $$aAnalyzing contrast in cryo-transmission electron microscopy: Comparison of electrostatic Zach phase plates and hole-free phase plates
000095473 260__ $$c2020
000095473 5060_ $$aAccess copy available to the general public$$fUnrestricted
000095473 5203_ $$aPhase plates (PPs) are beneficial devices to improve the phase contrast of life-science objects in cryo-transmission electron microscopy (TEM). The development of the hole-free (HF) PP, which consists of a thin carbon film, has led to impressive results due to its ease in fabrication, implementation and application. However, the phase shift of the HFPP can be controlled only indirectly. The electrostatic Zach PP uses a strongly localized and adjustable electrostatic potential to generate well-defined and variable phase shifts between scattered and unscattered electrons. However, artifacts in phase-contrast TEM images are induced by the presence of the PP rod in the diffraction plane. We present a detailed analysis and comparison of the contrast-enhancing capabilities of both PP types and their emerging artifacts. For this purpose, cryo-TEM images of a standard T4-bacteriophage test sample were acquired with both PP types. Simulated images reproduce the experimental images well and substantially contribute to the understanding of contrast formation. An electrostatic Zach PP was used in this work to acquire cryo-electron tomograms with enhanced contrast, which are of similar quality as tomograms obtained by HFPP TEM.
000095473 540__ $$9info:eu-repo/semantics/openAccess$$aby-nc-nd$$uhttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
000095473 590__ $$a2.689$$b2020
000095473 591__ $$aMICROSCOPY$$b4 / 9 = 0.444$$c2020$$dQ2$$eT2
000095473 592__ $$a1.29$$b2020
000095473 593__ $$aAtomic and Molecular Physics, and Optics$$c2020$$dQ1
000095473 593__ $$aInstrumentation$$c2020$$dQ1
000095473 593__ $$aElectronic, Optical and Magnetic Materials$$c2020$$dQ1
000095473 655_4 $$ainfo:eu-repo/semantics/article$$vinfo:eu-repo/semantics/publishedVersion
000095473 700__ $$0(orcid)0000-0002-9102-7895$$aHettler, S.
000095473 700__ $$aHsieh, C.
000095473 700__ $$aDries, M.
000095473 700__ $$aMarko, M.
000095473 700__ $$aGerthsen, D.
000095473 773__ $$g218 (2020), 113086 1-14$$pUltramicroscopy$$tULTRAMICROSCOPY$$x0304-3991
000095473 8564_ $$s15244619$$uhttps://zaguan.unizar.es/record/95473/files/texto_completo.pdf$$yVersión publicada
000095473 8564_ $$s68236$$uhttps://zaguan.unizar.es/record/95473/files/texto_completo.jpg?subformat=icon$$xicon$$yVersión publicada
000095473 909CO $$ooai:zaguan.unizar.es:95473$$particulos$$pdriver
000095473 951__ $$a2021-09-02-09:35:04
000095473 980__ $$aARTICLE