<?xml version="1.0" encoding="UTF-8"?>
<xml>
<records>
<record>
  <contributors>
    <authors>
      <author>De Teresa, J. M.</author>
      <author>Orús, P.</author>
      <author>Córdoba, R.</author>
      <author>Philipp, P.</author>
    </authors>
  </contributors>
  <titles>
    <title>Comparison between focused electron/ion beam-induced deposition at room temperature and under cryogenic conditions</title>
    <secondary-title>Micromachines (Basel)</secondary-title>
  </titles>
  <doi>10.3390/mi10120799</doi>
  <pages/>
  <volume/>
  <number/>
  <dates>
    <year>2019</year>
    <pub-dates>
      <date>2019</date>
    </pub-dates>
  </dates>
  <abstract/>
</record>

</records>
</xml>