<?xml version="1.0" encoding="UTF-8"?>
<references>
<reference>
  <a1>De Teresa, J. M.</a1>
  <a2>Orús, P.</a2>
  <a2>Córdoba, R.</a2>
  <a2>Philipp, P.</a2>
  <t1>Comparison between focused electron/ion beam-induced deposition at room temperature and under cryogenic conditions</t1>
  <t2>Micromachines (Basel)</t2>
  <sn/>
  <op/>
  <vo/>
  <ab/>
  <la>eng</la>
  <k1/>
  <pb/>
  <pp/>
  <yr>2019</yr>
  <ed/>
  <ul>http://zaguan.unizar.es/record/95928/files/texto_completo.pdf;
	http://zaguan.unizar.es/record/95928/files/texto_completo.jpg?subformat=icon;
	</ul>
  <no>Imported from Invenio.</no>
</reference>

</references>