Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air

Ghosh, S. ; Haefner, J. ; Martín-Albo, J. ; Guenette, R. ; Li, X. ; Loya Villalpando, A.A. ; Burch, C. ; Adams, C. ; Álvarez, V. ; Arazi, L. ; Arnquist, I.J. ; Azevedo, C.D.R. ; Bailey, K. ; Ballester, F. ; Benlloch-Rodríguez, J.M. ; Borges, F.I.G.M. ; Byrnes, N. ; Cárcel, S. ; Carrión, J.V. ; Cebrián, S. (Universidad de Zaragoza) ; Church, E. ; Conde, C.A.N. ; Contreras, T. ; Díaz, G. ; Díaz, J. ; Diesburg, M. ; Escada, J. ; Esteve, R. ; Felkai, R. ; Fernandes, A.F.M. ; Fernandes, L.M.P. ; Ferrario, P. ; Ferreira, A.L. ; Freitas, E.D.C. ; Goldschmidt, A. ; Gómez-Cadenas, J.J. ; González-Díaz, D. ; Gutiérrez, R.M. ; Hafidi, K. ; Hauptman, J. ; Henriques, C.A.O. ; Hernando Morata, J.A. ; Herrero, P. ; Herrero, V. ; Ifergan, Y. ; Jones, B.J.P. ; Kekic, M. ; Labarga, L. ; Laing, A. ; Lebrun, P. ; López-March, N. ; Losada, M. ; Mano, R.D.P. ; Martínez, A. ; Martínez-Vara, M. ; Martínez-Lema, G. ; McDonald, A.D. ; Monrabal, F. ; Monteiro, C.M.B. ; Mora, F.J. ; Muñoz Vidal, J. ; Novella, P. ; Nygren, D.R. ; Palmeiro, B. ; Para, A. ; Pérez, J. ; Querol, M. ; Redwine, A. ; Renner, J. ; Repond, J. ; Riordan, S. ; Ripoll, L. ; Rodríguez García, Y. ; Rodríguez, J. ; Rogers, L. ; Romeo, B. ; Romo-Luque, C. ; Santos, F.P. ; dos Santos, J.M.F. ; Simón, A. ; Sorel, M. ; Stiegler, T. ; Toledo, J.F. ; Torrent, J. ; Usón, A. ; Veloso, J.F.C.A. ; Webb, R. ; Weiss-Babai, R. ; White, J.T. ; Woodruff, K. ; Yahlali, N. ; The, NEXT, collaboration

Resumen: Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm. We also see that the reflectance of PTFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.

Idioma: Inglés

DOI: 10.1088/1748-0221/15/11/P11031

Año: 2020

Publicado en: Journal of Instrumentation 15, 11 (2020), [16 pp]
ISSN: 1748-0221

Factor impacto JCR: 1.415 (2020)

Categ. JCR: INSTRUMENTS & INSTRUMENTATION rank: 50 / 64 = 0.781 (2020) - Q4 - T3

Factor impacto SCIMAGO: 0.74 - Mathematical Physics (Q1) - Instrumentation (Q1)

Financiación: info:eu-repo/grantAgreement/EC/H2020/674896/EU/The Elusives Enterprise: Asymmetries of the Invisible Universe/ELUSIVES
Financiación: info:eu-repo/grantAgreement/EC/H2020/690575/EU/InvisiblesPlus/InvisiblesPlus
Financiación: info:eu-repo/grantAgreement/EC/H2020/740055/EU/Molecule for low diffusion TPCs for rare event searches/MELODIC
Financiación: info:eu-repo/grantAgreement/ES/MINECO-MCIU/FIS2014-53371-C04
Financiación: info:eu-repo/grantAgreement/ES/MINECO-MCIU/RTI2018-095979
Financiación: info:eu-repo/grantAgreement/ES/MINECO/MDM-2016-0692
Financiación: info:eu-repo/grantAgreement/ES/MINECO/SEV-2014-0398

Tipo y forma: Artículo (PostPrint)

Área (Departamento): Área Física Atóm.Molec.y Nucl. (Dpto. Física Teórica)