Analysis of the Effective and Actual Lens Position by Different Formulas. Postoperative Application of a Ray-Tracing-Based Simulated Optical Model

Gargallo Yebra, Diana (Universidad de Zaragoza) ; Remón Martín, Laura (Universidad de Zaragoza) ; Pérez Escorza, Iván ; Castro Alonso, Francisco Javier (Universidad de Zaragoza)

Resumen: (1) Background: This study compares the effective lens position (ELP) and intraocular lens power (IOLP) derived from SRK/T, Hoffer Q, Holladay I, and Haigis formulas with the actual lens position (ALP) and the implanted IOLP after cataract surgery. Additionally, it aims to optimize ALP using a ray-tracing-based simulated optical model to achieve emmetropia. (2) Methods: A retrospective observational study was conducted on 43 eyes implanted with the same monofocal intraocular lens (IOL). Preoperative and postoperative biometric data were collected using the Lenstar LS900. Postoperative measurements included ALP, subjective refraction, and refraction error (RE). Optical simulations (OSLO EDU 6.6.0) were utilized to optimize ALP for emmetropia (ALPIDEAL). (3) Results: Paired t-test results between REOSLO-REOBJ (p-value = 0.660) and REOSLO-RESUB (p-value = 0.789) indicated no significant statistical differences. However, statistically significant differences were found between ALP and ALPIDEAL (p < 0.05), with a difference of −0.04 ± 0.45 mm [ranging from −1.00 to 1.20 mm]. A significant correlation was observed between ΔALP (ΔALP = ALP − ALPIDEAL) and RESUBJ. (4) Conclusions: This customized ray-tracing eye model effectively achieves refractive outcomes similar to those obtained both subjectively and objectively post-surgery. Additionally, it has enabled optical simulations to optimize the IOL position and achieve emmetropia.

Idioma: Inglés

DOI: 10.3390/photonics11080711

Año: 2024

Publicado en: Photonics 11, 8 (2024), 711 [10 pp.]
ISSN: 2304-6732

Tipo y forma: Artículo (Versión definitiva)

Área (Departamento): Área Oftalmología (Dpto. Cirugía)
Área (Departamento): Área Óptica (Dpto. Física Aplicada)