Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy
Hettler, Simon ; Furqan, Mohammad ; Sotelo, Andrés (Universidad de Zaragoza) ; Arenal, Raul
Resumen: We explore the possibility to perform an in-situ transmission electron microscopy (TEM) thermoelectric characterization of materials. A differential heating element on a custom in-situ TEM microchip allows to generate a temperature gradient across the studied materials, which are simultaneously measured electrically. A thermovoltage was induced in all studied devices, whose sign corresponds to the sign of the Seebeck coefficient of the tested materials. The results indicate that in-situ thermoelectric TEM studies can help to profoundly understand fundamental aspects of thermoelectricity, which is exemplary demonstrated by tracking the thermovoltage during in-situ crystallization of an amorphous Ge thin film. We propose an improved in-situ TEM microchip design, which should facilitate a full quantitative measurement of the induced temperature gradient, the electrical and thermal conductivities, as well as the Seebeck coefficient. The benefit of the in-situ approach is the possibility to directly correlate the thermoelectric properties with the structure and chemical composition of the entire studied device down to the atomic level, including grain boundaries, dopants or crystal defects, and to trace its dynamic evolution upon heating or during the application of electrical currents.
Idioma: Inglés
DOI: 10.1016/j.ultramic.2024.114071
Año: 2025
Publicado en: Ultramicroscopy 268 (2025), 114071 [10 pp.]
ISSN: 0304-3991
Financiación: info:eu-repo/grantAgreement/ES/AEI/CEX2023-001286-S
Financiación: info:eu-repo/grantAgreement/ES/AEI/PID2023-151080NB-I00
Financiación: info:eu-repo/grantAgreement/ES/DGA/E13-23R
Financiación: info:eu-repo/grantAgreement/EC/H2020/889546/EU/Properties of nanomaterials made from misfit-layered compounds revealed by electron microscopy and simulations/PROMISES
Financiación: info:eu-repo/grantAgreement/ES/MICINN-AEI/PID2019-104739GB-I00/AEI-10.13039-501100011033
Financiación: info:eu-repo/grantAgreement/ES/MICINN-AEI/PRTR-C17.I1
Tipo y forma: Article (Published version)
Área (Departamento): Área Cienc.Mater. Ingen.Metal. (Dpto. Ciencia Tecnol.Mater.Fl.)
You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use. You may not use the material for commercial purposes.
Exportado de SIDERAL (2024-12-05-08:46:42)
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Idioma: Inglés
DOI: 10.1016/j.ultramic.2024.114071
Año: 2025
Publicado en: Ultramicroscopy 268 (2025), 114071 [10 pp.]
ISSN: 0304-3991
Financiación: info:eu-repo/grantAgreement/ES/AEI/CEX2023-001286-S
Financiación: info:eu-repo/grantAgreement/ES/AEI/PID2023-151080NB-I00
Financiación: info:eu-repo/grantAgreement/ES/DGA/E13-23R
Financiación: info:eu-repo/grantAgreement/EC/H2020/889546/EU/Properties of nanomaterials made from misfit-layered compounds revealed by electron microscopy and simulations/PROMISES
Financiación: info:eu-repo/grantAgreement/ES/MICINN-AEI/PID2019-104739GB-I00/AEI-10.13039-501100011033
Financiación: info:eu-repo/grantAgreement/ES/MICINN-AEI/PRTR-C17.I1
Tipo y forma: Article (Published version)
Área (Departamento): Área Cienc.Mater. Ingen.Metal. (Dpto. Ciencia Tecnol.Mater.Fl.)
You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use. You may not use the material for commercial purposes. Exportado de SIDERAL (2024-12-05-08:46:42)
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Articles > Artículos por área > Ciencia de los Materiales e Ingeniería Metalúrgica
Record created 2024-12-05, last modified 2024-12-05