PolishEM: image enhancement in FIB-SEM
Resumen: We have developed a software tool to improve the image quality in focused ion beam-scanning electron microscopy (FIB-SEM) stacks: PolishEM. Based on a Gaussian blur model, it automatically estimates and compensates for the blur affecting each individual image. It also includes correction for artifacts commonly arising in FIB-SEM (e.g. curtaining). PolishEM has been optimized for an efficient processing of huge FIB-SEM stacks on standard computers.
Idioma: Inglés
DOI: 10.1093/bioinformatics/btaa218
Año: 2020
Publicado en: Bioinformatics 36, 12 (2020), 3947-3948
ISSN: 1367-4803

Factor impacto JCR: 6.937 (2020)
Categ. JCR: BIOCHEMICAL RESEARCH METHODS rank: 6 / 77 = 0.078 (2020) - Q1 - T1
Categ. JCR: MATHEMATICAL & COMPUTATIONAL BIOLOGY rank: 3 / 58 = 0.052 (2020) - Q1 - T1
Categ. JCR: BIOTECHNOLOGY & APPLIED MICROBIOLOGY rank: 18 / 158 = 0.114 (2020) - Q1 - T1

Factor impacto SCIMAGO: 3.599 - Biochemistry (Q1) - Computational Mathematics (Q1) - Statistics and Probability (Q1) - Computer Science Applications (Q1) - Molecular Biology (Q1) - Computational Theory and Mathematics (Q1)

Financiación: info:eu-repo/grantAgreement/ES/MICINN/SAF2017-84565-R
Tipo y forma: Article (Published version)
Área (Departamento): Área Física Materia Condensada (Dpto. Física Materia Condensa.)
Exportado de SIDERAL (2025-10-17-14:13:59)


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articulos > articulos-por-area > fisica_de_la_materia_condensada



 Notice créée le 2025-05-20, modifiée le 2025-10-17


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