PolishEM: image enhancement in FIB-SEM
Resumen: We have developed a software tool to improve the image quality in focused ion beam-scanning electron microscopy (FIB-SEM) stacks: PolishEM. Based on a Gaussian blur model, it automatically estimates and compensates for the blur affecting each individual image. It also includes correction for artifacts commonly arising in FIB-SEM (e.g. curtaining). PolishEM has been optimized for an efficient processing of huge FIB-SEM stacks on standard computers.
Idioma: Inglés
DOI: 10.1093/bioinformatics/btaa218
Año: 2020
Publicado en: Bioinformatics 36, 12 (2020), 3947-3948
ISSN: 1367-4803

Factor impacto JCR: 6.937 (2020)
Categ. JCR: BIOCHEMICAL RESEARCH METHODS rank: 6 / 77 = 0.078 (2020) - Q1 - T1
Categ. JCR: MATHEMATICAL & COMPUTATIONAL BIOLOGY rank: 3 / 58 = 0.052 (2020) - Q1 - T1
Categ. JCR: BIOTECHNOLOGY & APPLIED MICROBIOLOGY rank: 18 / 158 = 0.114 (2020) - Q1 - T1

Factor impacto SCIMAGO: 3.599 - Biochemistry (Q1) - Computational Mathematics (Q1) - Statistics and Probability (Q1) - Computer Science Applications (Q1) - Molecular Biology (Q1) - Computational Theory and Mathematics (Q1)

Financiación: info:eu-repo/grantAgreement/ES/MICINN/SAF2017-84565-R
Tipo y forma: Article (Published version)
Área (Departamento): Área Física Materia Condensada (Dpto. Física Materia Condensa.)

Creative Commons You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use. You may not use the material for commercial purposes.


Exportado de SIDERAL (2025-10-17-14:13:59)


Visitas y descargas

Este artículo se encuentra en las siguientes colecciones:
Articles > Artículos por área > Física de la Materia Condensada



 Record created 2025-05-20, last modified 2025-10-17


Versión publicada:
 PDF
Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)