Resumen: High-resolution mapping of electronic transport phenomena plays an increasingly important role for the characterization of ferroic domains and their functionality. At present, spatially resolved electronic transport data are commonly gained from local two-point measurements, collected in line-by-line scans with a conducting nanosized probe. Here, we introduce an innovative experimental approach based on low- energy electron microscopy. As a model case, we study polar domains of varying conductance in strained SrMnO3. By a direct comparison with conductive atomic force and electrostatic force microscopy, we reveal that the applied low-energy electron-microscopy experiment can be considered as an inverse IðVÞ measurement, providing access to the local electronic conductance with nanoscale resolution and short data-acquisition times in the order of 10–102 ms. Low-energy electrons thus hold yet unexplored application opportunities as a minimal-invasive probe for local electronic transport phenomena, opening a promising route towards spatially resolved, high-throughput sampling at the nanoscale. Idioma: Inglés DOI: 10.1103/PhysRevApplied.5.054009 Año: 2016 Publicado en: Physical review applied 5 (2016), 054009 [7 pp.] ISSN: 2331-7019 Factor impacto JCR: 4.808 (2016) Categ. JCR: PHYSICS, APPLIED rank: 21 / 147 = 0.143 (2016) - Q1 - T1 Factor impacto SCIMAGO: 2.448 - Physics and Astronomy (miscellaneous) (Q1)